SID 2022

SID 2022

SID 2022 brings new ideas...

This year, in the area of electronic troubleshooting, the big topic for us is "Innovation in Technologies and Methods". We introduce new "Root Cause Analysis Methods".
New principles for inline capable non-destructive analytics help to avoid bad User Experiences.

Example: A NON-destructive approach

Many large projects are already affected in daily use and are unfortunately no longer repairable in this situation.
In the meantime, we can relatively easily evaluate root-causes and possible remedies in the context of troubleshooting.

More details...- This email address is being protected from spambots. You need JavaScript enabled to view it. -

Info

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Contact

Wammes & Partner GmbH
An der Weidenmühle 2
D-67598 Gundersheim
Germany

Tel. +49 (0) 6244 / 9197-100
Fax +49 (0) 6244 / 9197-111 

E-Mail: info@wp-rd.de

Patents: to overview

Brands

EDCG  
   
i-sft global-lightz
  • display measurements
  • display fingerprint
  • Degradation
  • dead pixels
  • colorful stars
  • coaching and consulting
  • can LCs degrade
  • application profile
  • AG surface
  • 3d to volumetric
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